[IEEE 2010 23rd Annual Meeting of the IEEE Photonics Society (Formerly LEOS Annual Meeting) - Denver, CO, USA (2010.11.7-2010.11.11)] 2010 IEEE Photinic Society's 23rd Annual Meeting - Measuring the linewidth enhancement factor of optoelectronics devices based on a Mach-Zehnder interferometer
Provost, Jean-Guy, Grillot, FredericYear:
2010
Language:
english
DOI:
10.1109/photonics.2010.5698941
File:
PDF, 429 KB
english, 2010