High-resolution strain mapping in bulk samples using...

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2005 Vol. 238; Iss. 1-4

High-resolution strain mapping in bulk samples using full-profile analysis of energy dispersive synchrotron X-ray diffraction data

A. Steuwer, J.R. Santisteban, M. Turski, P.J. Withers, T. Buslaps
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Volume:
238
Year:
2005
Language:
english
Pages:
5
DOI:
10.1016/j.nimb.2005.06.049
File:
PDF, 257 KB
english, 2005
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