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[IEEE Second IEEE International Workshop on Electronic Design, Test and Applications - Perth, Australia (28-30 Jan. 2004)] Second IEEE International Workshop on Electronic Design, Test and Applications - On Configuring Scan Trees to Reduce Scan Shifts based on a Circuit Structure
Yotsuyanagi, H., Kuchii, T., Nishikawa, S., Hashizume, M., Kinoshita, K.Year:
2004
Language:
english
DOI:
10.1109/delta.2004.10014
File:
PDF, 276 KB
english, 2004