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[IEEE 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (21-25 July 1997)] Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Open fault detection method for CMOS-LSI by supplying pulsed voltage signal to VDD and GND lines
Sumitomo, H., Nakamura, T.Year:
1997
Language:
english
DOI:
10.1109/IPFA.1997.638123
File:
PDF, 904 KB
english, 1997