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[IEEE 2008 International Conference on High Voltage Engineering and Application (ICHVE) - Chongqing, China (2008.11.9-2008.11.12)] 2008 International Conference on High Voltage Engineering and Application - Correlating Digital Measurements of Electrical Quantities and Related Images on Micro Discharges under High Voltages
Cardoso, Jose A. A., Filho, Orsino Oliveira, Levy, Alain F. S.Year:
2008
Language:
english
DOI:
10.1109/ichve.2008.4773946
File:
PDF, 491 KB
english, 2008