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[IEEE 26th IEEE VLSI Test Symposium (vts 2008) - San Diego, CA, USA (2008.04.27-2008.05.1)] 26th IEEE VLSI Test Symposium (vts 2008) - Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits
Kim, Byoungho, Khouzam, Nash, Abraham, Jacob A.Year:
2008
Language:
english
DOI:
10.1109/vts.2008.52
File:
PDF, 358 KB
english, 2008