[IEEE Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's - Atlantic City, NJ, USA (15-17 April 1991)] Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's - An analysis and testing of operation induced faults in MOS VLSI

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