[IEEE 2007 IEEE 66th Vehicular Technology Conference - Baltimore, MD, USA (2007.09.30-2007.10.3)] 2007 IEEE 66th Vehicular Technology Conference - Analytical Envelope Correlation and Outage Probability of Maximal-Ratio Combined Rician Fading Channels
Wang, Zhuwei, Hu, Yanfen, Chen, Xubin, Zhang, Xin, Yang, DachengYear:
2007
Language:
english
DOI:
10.1109/vetecf.2007.202
File:
PDF, 241 KB
english, 2007