Multilevel-Huffman Test-Data Compression for IP Cores With Multiple Scan Chains
Kavousianos, Xrysovalantis, Kalligeros, Emmanouil, Nikolos, DimitrisVolume:
16
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2008.2000448
Date:
July, 2008
File:
PDF, 433 KB
english, 2008