[IEEE International Test Conference, 2003. ITC 2003. - Charlotte, NC, USA (Sept. 30,-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - An extension to JTAG for at-speed debug on a system
van de Logt, L., van der Heyden, F., Waayers, T.Volume:
2
Year:
2003
Language:
english
DOI:
10.1109/test.2003.1271202
File:
PDF, 540 KB
english, 2003