[IEEE 2013 IEEE 10th International Conference on ASIC (ASICON 2013) - Shenzhen, China (2013.10.28-2013.10.31)] 2013 IEEE 10th International Conference on ASIC - Lithography hotspot detection and mitigation in nanometer VLSI
Gao, Jhih-Rong, Yu, Bei, Ding, Duo, Pan, David Z.Year:
2013
Language:
english
DOI:
10.1109/asicon.2013.6811917
File:
PDF, 257 KB
english, 2013