[IEEE 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Arlington, VA, USA (2006.10.4-2006.10.4)] 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies
La Haye, Michelle, Jung, Cory, Chen, David, Chapman, Glenn, Dudas, JozsefYear:
2006
Language:
english
DOI:
10.1109/dft.2006.31
File:
PDF, 219 KB
english, 2006