[IEEE Fourth IEEE International Symposium on Signal Processing and Information Technology, 2004. - Rome, Italy (Dec. 18-21, 2004)] Proceedings of the Fourth IEEE International Symposium on Signal Processing and Information Technology, 2004. - A mathematical morphological method to thin edge detection in dark region
Ying-Tung Hsiao,, Cheng-Long Chuang,, Shwu-Huey Yen,, Hwei-Jen Lin,Year:
2004
Language:
english
DOI:
10.1109/isspit.2004.1433746
File:
PDF, 737 KB
english, 2004