An aspect of second breakdown in transistors

Proceedings of the IEEE 1964 Vol. 52; Iss. 11

An aspect of second breakdown in transistors

Agatsuma, T., Kohisa, T., Sugiyama, A.
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Volume:
52
Year:
1964
Language:
english
Journal:
Proceedings of the IEEE
DOI:
10.1109/proc.1964.3396
File:
PDF, 216 KB
english, 1964
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