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[IEEE 2011 International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Suita, Osaka, Japan (2011.05.19-2011.05.20)] 2011 International Meeting for Future of Electron Devices - Microscopic electrical characterization of fixed-charge-controlled passivation films for Si solar cells
Fujieda, J., Matsutani, R., Hamano, J., Yoshida, H., Arafune, K., Satoh, S., Tachibana, T., Ikeno, N., Lee, H., Ogura, A., Chikyow, T.Year:
2011
Language:
english
DOI:
10.1109/imfedk.2011.5944851
File:
PDF, 174 KB
english, 2011