Failure diagnosis of structured VLSI

IEEE Design & Test of Computers 1989 / 08 Vol. 6; Iss. 4

Failure diagnosis of structured VLSI

Waicukauski, J.A., Lindbloom, E.
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Volume:
6
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/54.32421
Date:
August, 1989
File:
PDF, 880 KB
english, 1989
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