An ion beam facility for HCI-based analysis and materials...

An ion beam facility for HCI-based analysis and materials research

Günter Zschornack, Steffen Landgraf, Frank Großmann, Ulrich Kentsch, Vladimir P. Ovsyannikov, Mike Schmidt, Falk Ullmann
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Volume:
249
Year:
2006
Language:
english
Pages:
3
DOI:
10.1016/j.nimb.2006.03.164
File:
PDF, 465 KB
english, 2006
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