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[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Embedded synthetic instruments for Board-Level testing
Jutman, Artur, Devadze, Sergei, Aleksejev, Igor, Wenzel, ThomasYear:
2012
Language:
english
DOI:
10.1109/ets.2012.6233044
File:
PDF, 159 KB
english, 2012