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[IEEE International Electron Devices Meeting. Technical Digest - San Francisco, CA, USA (8-11 Dec. 1996)] International Electron Devices Meeting. Technical Digest - RTD/HFET low standby power SRAM gain cell
van der Wage, P., Seabaugh, A., Beam, E.Year:
1996
Language:
english
DOI:
10.1109/iedm.1996.553618
File:
PDF, 400 KB
english, 1996