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[IEEE 2011 5th IEEE International Conference on Digital Ecosystems and Technologies (DEST) - Daejeon, Korea (South) (2011.05.31-2011.06.3)] 5th IEEE International Conference on Digital Ecosystems and Technologies (IEEE DEST 2011) - Component level risk assessment in Grids: A probablistic risk model and experimentation
Sangrasi, Asif, Djemame, KarimYear:
2011
Language:
english
DOI:
10.1109/dest.2011.5936600
File:
PDF, 1.75 MB
english, 2011