![](/img/cover-not-exists.png)
[IEEE 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Enschede, The Netherlands (8-11 October 1996)] Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - A new technique to characterize the early stages of electromigration-induced resistance changes at low current densities
D'Haeger, V., de Ceuninck, W., Knuyt, G., de Schepper, L., Stals, L.M.Year:
1996
Language:
english
DOI:
10.1109/esref.1996.888194
File:
PDF, 277 KB
english, 1996