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[IEEE 2010 International Conference on High Voltage Engineering and Application (ICHVE) - New Orleans, LA, USA (2010.10.11-2010.10.14)] 2010 International Conference on High Voltage Engineering and Application - Influence of contamination on deteriorated insulators detection with infrared imaging method
Jiang, Xingliang, Xia, QiangfengYear:
2010
Language:
english
DOI:
10.1109/ichve.2010.5640729
File:
PDF, 355 KB
english, 2010