[IEEE 2010 10th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) - New Orleans, LA, USA (2010.01.11-2010.01.13)] 2010 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) - Novel BiST methods for parametric test in wireless transceivers
Webster, D., Thiagarajan, G., Ramakrishnan, S., Gunturi, S., Sontakke, A., Lie, D.Y.C.Year:
2010
Language:
english
DOI:
10.1109/smic.2010.5422977
File:
PDF, 262 KB
english, 2010