[IEEE 2009 IEEE AUTOTESTCON - Anaheim, CA, USA (2009.09.14-2009.09.17)] 2009 IEEE AUTOTESTCON - How to mitigate hardware obsolescence in next-generation test systems
Tacha, Nathan, McCarthy, Alex, Powell, Brian, Veeramani, ArunYear:
2009
Language:
english
DOI:
10.1109/autest.2009.5314087
File:
PDF, 900 KB
english, 2009