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[IEEE 2012 IEEE International Power Modulator and High Voltage Conference (IPMHVC) - San Diego, CA, USA (2012.06.3-2012.06.7)] 2012 IEEE International Power Modulator and High Voltage Conference (IPMHVC) - To electrically locate gate oxide defects in dual-gate technologies for various high-voltage domains
Sheng, Lieyi, Glines, EddieYear:
2012
Language:
english
DOI:
10.1109/ipmhvc.2012.6518767
File:
PDF, 373 KB
english, 2012