[IEEE 2001 International Symposium on Electron Devices for Microwave and Optoelectronic Applications. EDMO 2001 - Vienna, Austria (15-16 Nov. 2001)] 2001 International Symposium on Electron Devices for Microwave and Optoelectronic Applications. EDMO 2001 (Cat. No.01TH8567) - Dependence of impact ionization and kink on surface-deep-level dynamics in AlGaAs/GaAs HFETs
Mazzanti, A., Verzellesi, G., Vicini, L., Canali, C., Chini, A., Meneghesso, G., Zanoni, E., Lanzieri, C.Year:
2001
Language:
english
DOI:
10.1109/edmo.2001.974297
File:
PDF, 426 KB
english, 2001