[IEEE 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Mumbai, India (2010.12.14-2010.12.16)] 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Reliability analysis of Safety Logic with Fine Impulse Test system of Indian Prototype Fast Breeder Reactor