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[IEEE 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Mumbai, India (2010.12.14-2010.12.16)] 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Reliability analysis of Safety Logic with Fine Impulse Test system of Indian Prototype Fast Breeder Reactor
Misra, M. K., Sridhar, N., Krishnakumar, B., Murty, S.A.V. Satya, Swaminathan, P.Year:
2010
Language:
english
DOI:
10.1109/ICRESH.2010.5779585
File:
PDF, 359 KB
english, 2010