[IEEE 2010 2nd International Conference on Reliability,...

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[IEEE 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Mumbai, India (2010.12.14-2010.12.16)] 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - A case study on application of HAZOP for intermediate level radioactive liquid waste treatment facility

Jasu, Nilay J., Kumar, Kiran, Gangadharan, Anand, Tomar, Neelima S., Verma, B. B., Raj, Kanwar
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Year:
2010
Language:
english
DOI:
10.1109/ICRESH.2010.5779624
File:
PDF, 833 KB
english, 2010
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