Study of ionization processes during TOF-SIMS analysis by...

Study of ionization processes during TOF-SIMS analysis by co-sputtering cesium and xenon

J. Brison, L. Houssiau
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Volume:
259
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.nimb.2007.02.103
File:
PDF, 236 KB
english, 2007
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