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[IEEE 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2010.06.1-2010.06.4)] 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) - A synchrotron micro-diffraction investigation of crystallographic texture of high-Sn alloy films and its effects on whisker growth
Sarobol, Pylin, Pedigo, Aaron, Blendell, John, Handwerker, Carol, Su, Peng, Li, Li, Xue, JieYear:
2010
Language:
english
DOI:
10.1109/ectc.2010.5490896
File:
PDF, 1.37 MB
english, 2010