Development of a cyber security risk model using Bayesian networks
Shin, Jinsoo, Son, Hanseong, Khalil ur, Rahman, Heo, GyunyoungVolume:
134
Language:
english
Journal:
Reliability Engineering & System Safety
DOI:
10.1016/j.ress.2014.10.006
Date:
February, 2015
File:
PDF, 1.47 MB
english, 2015