Complementarities of nuclear-based analytical techniques...

Complementarities of nuclear-based analytical techniques for the characterization of thin film technological materials

Samuel Bamford, Peter Kregsamer, Stjepko Fazinic, Milko Jaksic, Dariusz Wegrzynek, Ernesto Chinea-Cano, Andrzej Markowicz
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Volume:
261
Year:
2007
Language:
english
Pages:
3
DOI:
10.1016/j.nimb.2007.03.066
File:
PDF, 317 KB
english, 2007
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