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[IEEE 6th International Conference on Solid-State and IC Technology - Shanghai, China (22-25 Oct. 2001)] 2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443) - Another way to investigate the characteristics of time-dependent dielectric breakdown of ultra-thin oxides
Fuchen Mu,, Mingzben Xu,, Changhua Tan,, Xiaorong Duan,Volume:
2
Year:
2001
Language:
english
DOI:
10.1109/icsict.2001.982067
File:
PDF, 205 KB
english, 2001