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[IEEE 2007 IEEE International Symposium on Circuits and Systems - New Orleans, LA, USA (2007.05.27-2007.05.30)] 2007 IEEE International Symposium on Circuits and Systems - Design for Secure Test - A Case Study on Pipelined Advanced Encryption Standard
Shi, Youhua, Togawa, Nozomu, Yanagisawa, Masao, Ohtsuki, TatsuoYear:
2007
Language:
english
DOI:
10.1109/iscas.2007.378243
File:
PDF, 139 KB
english, 2007