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[IEEE 2010 11th Latin American Test Workshop - LATW - Punta del Este, Uruguay (2010.03.28-2010.03.31)] 2010 11th Latin American Test Workshop - Emulating an Agilent™ 4142 on a Keithley™ 2600 series Source Measurement Unit
Moreno, Jorge, Gonzalez, Osvaldo, Vega, Rafael, Palomera, Rogelio, Jimenez, ManuelYear:
2010
DOI:
10.1109/latw.2010.5550376
File:
PDF, 223 KB
2010