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[IEEE 2008 IEEE International SOC Conference (SOCC) - Newport Beach, CA, USA (2008.09.17-2008.09.20)] 2008 IEEE International SOC Conference - Failure analysis for ultra low power nano-CMOS SRAM under process variations

Singh, Jawar, Mathew, Jimson, Pradhan, Dhiraj K., Mohanty, Saraju P.
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Year:
2008
Language:
english
DOI:
10.1109/socc.2008.4641522
File:
PDF, 407 KB
english, 2008
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