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[IEEE 1994 IEEE International Conference on Neural Networks (ICNN'94) - Orlando, FL, USA (27 June-2 July 1994)] Proceedings of 1994 IEEE International Conference on Neural Networks (ICNN'94) - Behavioral testability and test pattern generation of the Hopfield network model
Alippi, C., Fummi, F., Piuri, R., Sami, M., Sciuto, D.Volume:
7
Year:
1994
Language:
english
DOI:
10.1109/icnn.1994.375011
File:
PDF, 531 KB
english, 1994