Effect of leakage current through ferroelectric and insulator on retention characteristics of metal-ferroelectric-insulator-semiconductor structure
Takahashi, Mitsue, Kodama, Kazushi, Nakaiso, Toshiyuki, Noda, Minoru, Okuyama, MasanoriVolume:
40
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584580108010835
Date:
January, 2001
File:
PDF, 491 KB
english, 2001