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[IEEE 2014 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Tampa, FL, USA (2014.7.9-2014.7.11)] 2014 IEEE Computer Society Annual Symposium on VLSI - Impact of Process Variations on Reliability and Performance of 32-nm 6T SRAM at Near Threshold Voltage
Kou, Lingbo, Robinson, William H.Year:
2014
Language:
english
DOI:
10.1109/ISVLSI.2014.73
File:
PDF, 794 KB
english, 2014