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[IEEE 2000 IEEE MTT-S International Microwave Symposium Digest - Boston, MA, USA (11-16 June 2000)] 2000 IEEE MTT-S International Microwave Symposium Digest (Cat. No.00CH37017) - Characterization and modeling of nonlinear trapping effects in power SiC MESFETs
Siriex, D., Barataud, D., Sommet, R., Noblanc, O., Ouarch, Z., Brylinski, Ch., Teyssier, J.P., Quere, R.Volume:
2
Year:
2000
Language:
english
DOI:
10.1109/mwsym.2000.863294
File:
PDF, 314 KB
english, 2000