Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
2008 Vol. 266; Iss. 8
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Complementary use of ion beam elastic backscattering and recoil detection analysis for the precise determination of the composition of thin films made of light elements
A. Climent-Font, M. Cervera, M.J. Hernández, A. Muñoz-Martín, J. PiquerasVolume:
266
Year:
2008
Language:
english
Pages:
4
DOI:
10.1016/j.nimb.2007.11.013
File:
PDF, 1.86 MB
english, 2008