[IEEE 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009) - Sesimbra-Lisbon, Portugal (2009.06.24-2009.06.26)] 2009 15th IEEE International On-Line Testing Symposium - In-depth analysis of digital circuits against soft errors for selective hardening
Garcia-Valderas, Mario, Portela-Garcia, Marta, Lopez-Ongil, Celia, Entrena, LuisYear:
2009
Language:
english
DOI:
10.1109/iolts.2009.5195997
File:
PDF, 155 KB
english, 2009