[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - Leveraging IEEE 1641 for Tester-Independent ATE Software
Van Wagenen, B., Vollmar, J., Thornton, D.Year:
2008
Language:
english
DOI:
10.1109/test.2008.4700608
File:
PDF, 390 KB
english, 2008