Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
2008 Vol. 266; Iss. 8
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Incident-angle dependence of ion-induced electron emission from Al & Co films using swift heavy ion
R.S. Chauhan, Sarvesh Kumar, R.P. Singh, A. MandalVolume:
266
Year:
2008
Language:
english
Pages:
3
DOI:
10.1016/j.nimb.2007.12.108
File:
PDF, 112 KB
english, 2008