Strain-free Al0.08In0.018Ga0.902N/GaN heterostructure:...

Strain-free Al0.08In0.018Ga0.902N/GaN heterostructure: Combined Rutherford backscattering/channeling and high resolution X-ray diffraction

Huan Wang, Tianxiang Chen, Shude Yao
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Volume:
266
Year:
2008
Language:
english
Pages:
3
DOI:
10.1016/j.nimb.2008.02.069
File:
PDF, 362 KB
english, 2008
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