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[IEEE Seventh International Workshop on Microprocessor Test and Verification (MTV'06) - Austin, TX, USA (2006.12.4-2006.12.5)] Seventh International Workshop on Microprocessor Test and Verification (MTV'06) - Diagnosing Silicon Failures Based on Functional Test Patterns
Yen, Chia-Chih, Lin, Ten, Lin, Hermes, Yang, Kai, Liu, Tayung, Hsu, Yu-ChinYear:
2006
Language:
english
DOI:
10.1109/mtv.2006.9
File:
PDF, 464 KB
english, 2006