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[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - Quasi-dense Wide Baseline Matching for Three Views
Koskenkorva, Pekka, Kannala, Juho, Brandt, Sami S.Year:
2010
Language:
english
DOI:
10.1109/icpr.2010.203
File:
PDF, 1.32 MB
english, 2010