[IEEE IEEE 1999 International Interconnect Technology...

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[IEEE IEEE 1999 International Interconnect Technology Conference - San Francisco, CA, USA (24-26 May 1999)] Proceedings of the IEEE 1999 International Interconnect Technology Conference (Cat. No.99EX247) - New effect of Ti-capping layer in Co salicide process promising for deep sub-quarter micron technology

Ja-Hum Ku,, Chul-Sung Kim,, Chul-Joon Choi,, Fujihara, K., Ho-Kyu Kang,, Moon-Yong Lee,, Ju-Hyuck Chung,, Eung-Joon Lee,, Jang-Eun Lee,, Dae-Hong Ko,
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Year:
1999
Language:
english
DOI:
10.1109/iitc.1999.787137
File:
PDF, 293 KB
english, 1999
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