Simultaneous Measurements of Refractive Index and Thickness...

IEEE Photonics Technology Letters 2011 / 08 Vol. 23; Iss. 15

Simultaneous Measurements of Refractive Index and Thickness by Spectral-Domain Low Coherence Interferometry Having Dual Sample Probes

Park, Seong Jun, Park, Kwan Seob, Kim, Young Ho, Lee, Byeong Ha
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Volume:
23
Language:
english
Journal:
IEEE Photonics Technology Letters
DOI:
10.1109/LPT.2011.2155642
Date:
August, 2011
File:
PDF, 451 KB
english, 2011
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