Single-shot thermal energy mapping of semiconductor devices...

IEEE Electron Device Letters 2002 / 10 Vol. 23; Iss. 10

Single-shot thermal energy mapping of semiconductor devices with the nanosecond resolution using holographic interferometry

Pogany, D., Dubec, V., Bychikhin, S., Furbock, C., Litzenberger, A., Groos, G., Stecher, M., Gornik, E.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
23
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2002.803752
Date:
October, 2002
File:
PDF, 300 KB
english, 2002
Conversion to is in progress
Conversion to is failed